Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey

Abderrahim Doumar, Hideo Ito. Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey. IEEE Trans. VLSI Syst., 11(3):386-405, 2003. [doi]

Authors

Abderrahim Doumar

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Hideo Ito

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