Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey

Abderrahim Doumar, Hideo Ito. Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey. IEEE Trans. VLSI Syst., 11(3):386-405, 2003. [doi]

Abstract

Abstract is missing.