Abderrahim Doumar, Hideo Ito. Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey. IEEE Trans. VLSI Syst., 11(3):386-405, 2003. [doi]
@article{DoumarI03,
title = {Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey},
author = {Abderrahim Doumar and Hideo Ito},
year = {2003},
doi = {10.1109/TVLSI.2002.801609},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2002.801609},
tags = {rule-based, survey},
researchr = {https://researchr.org/publication/DoumarI03},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {11},
number = {3},
pages = {386-405},
}