Rolf Drechsler, Harry Hengster, Horst Schäfer, Joachim Hartmann, Bernd Becker. Testability of 2-level AND/EXOR circuits. In European Design and Test Conference (ED&TC 97), Paris, France, 17-20 March 1997. pages 548-553, IEEE, 1997. [doi]
Abstract is missing.