David E. Duarte, George Geannopoulos, Usman Mughal, Keng L. Wong, Greg Taylor. Temperature Sensor Design in a High Volume Manufacturing 65nm CMOS Digital Process. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 221-224, IEEE, 2007. [doi]
@inproceedings{DuarteGMWT07,
title = {Temperature Sensor Design in a High Volume Manufacturing 65nm CMOS Digital Process},
author = {David E. Duarte and George Geannopoulos and Usman Mughal and Keng L. Wong and Greg Taylor},
year = {2007},
doi = {10.1109/CICC.2007.4405718},
url = {http://dx.doi.org/10.1109/CICC.2007.4405718},
researchr = {https://researchr.org/publication/DuarteGMWT07},
cites = {0},
citedby = {0},
pages = {221-224},
booktitle = {Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007},
publisher = {IEEE},
isbn = {978-1-4244-1623-3},
}