Gladys Omayra Ducoudray, Jaime Ramírez-Angulo. Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard. J. Electronic Testing, 19(1):21-28, 2003. [doi]
@article{DucoudrayR03,
title = {Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard},
author = {Gladys Omayra Ducoudray and Jaime Ramírez-Angulo},
year = {2003},
doi = {10.1023/A:1021987727515},
url = {http://dx.doi.org/10.1023/A:1021987727515},
tags = {testing},
researchr = {https://researchr.org/publication/DucoudrayR03},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {19},
number = {1},
pages = {21-28},
}