Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard

Gladys Omayra Ducoudray, Jaime Ramírez-Angulo. Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard. J. Electronic Testing, 19(1):21-28, 2003. [doi]

Abstract

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