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Gladys Omayra Ducoudray, Jaime Ramírez-Angulo. Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard. J. Electronic Testing, 19(1):21-28, 2003. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus StandardGladys Omayra Ducoudray Acevedo, Jaime Ramírez-Angulo. latw 2001: 131-134 Built-in self-test scheme for on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standardG. O. D. Acevedo, Jaime Ramírez-Angulo. iscas 2002: 149-152 [doi]
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