Stephan EggersgluB, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler. On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(12):2104-2117, 2016. [doi]
@article{EggersgluBSKD16,
title = {On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets},
author = {Stephan EggersgluB and Kenneth Schmitz and Rene Krenz-Baath and Rolf Drechsler},
year = {2016},
doi = {10.1109/TCAD.2016.2552822},
url = {http://dx.doi.org/10.1109/TCAD.2016.2552822},
researchr = {https://researchr.org/publication/EggersgluBSKD16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {35},
number = {12},
pages = {2104-2117},
}