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Stephan EggersgluB, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler. On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(12):2104-2117, 2016. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A new SAT-based ATPG for generating highly compacted test setsStephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler. ddecs 2012: 230-235 [doi] Optimization-based multiple target test generation for highly compacted test setsStephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler. ets 2014: 1-6 [doi]
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