Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler. A new SAT-based ATPG for generating highly compacted test sets. In Jaan Raik, Viera Stopjaková, Heinrich Theodor Vierhaus, Witold A. Pleskacz, Raimund Ubar, Helena Kruus, Maksim Jenihhin, editors, IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2012, Tallinn, Estonia, April 18-20, 2012. pages 230-235, IEEE, 2012. [doi]
Abstract is missing.