Improving Test Pattern Compactness in SAT-based ATPG

Stephan Eggersglüß, Rolf Drechsler. Improving Test Pattern Compactness in SAT-based ATPG. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 445-452, IEEE, 2007. [doi]

Abstract

Abstract is missing.