Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques - researchr publication

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Stephan Eggersglüß, Rolf Drechsler. Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 81-86, IEEE Computer Society, 2009. [doi]

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