A logic design structure for LSI testability - researchr publication authors

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Edward B. Eichelberger, Thomas W. Williams. A logic design structure for LSI testability. In Judith G. Brinsfield, Stephen A. Szygenda, David W. Hightower, editors, Proceedings of the 14th Design Automation Conference, DAC '77, New Orleans, Louisiana, USA, June 20-22, 1977. pages 462-468, ACM, 1977. [doi]

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