Edward B. Eichelberger, Thomas W. Williams. A logic design structure for LSI testability. In Judith G. Brinsfield, Stephen A. Szygenda, David W. Hightower, editors, Proceedings of the 14th Design Automation Conference, DAC '77, New Orleans, Louisiana, USA, June 20-22, 1977. pages 462-468, ACM, 1977. [doi]
@inproceedings{EichelbergerW77,
title = {A logic design structure for LSI testability},
author = {Edward B. Eichelberger and Thomas W. Williams},
year = {1977},
url = {http://dl.acm.org/citation.cfm?id=809170},
researchr = {https://researchr.org/publication/EichelbergerW77},
cites = {0},
citedby = {0},
pages = {462-468},
booktitle = {Proceedings of the 14th Design Automation Conference, DAC '77, New Orleans, Louisiana, USA, June 20-22, 1977},
editor = {Judith G. Brinsfield and Stephen A. Szygenda and David W. Hightower},
publisher = {ACM},
}