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Aiman H. El-Maleh, Khaled Al-Utaibi. On efficient extraction of partially specified test sets for synchronous sequential circuits. In ISCAS (3). pages 545-548, 2003. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: An Efficient Test Relaxation Technique for Synchronous Sequential CircuitsAiman H. El-Maleh, Khaled Al-Utaibi. vts 2003: 179-185 [doi] An efficient test relaxation technique for synchronous sequential circuitsAiman H. El-Maleh, Khaled Al-Utaibi. tcad, 23(6):933-940, 2004. [doi]
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