ATREX : Design for Testability System for Mega Gate LSIs - researchr publication authors

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Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi. ATREX : Design for Testability System for Mega Gate LSIs. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 126, IEEE Computer Society, 1997. [doi]

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