Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi. ATREX : Design for Testability System for Mega Gate LSIs. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 126, IEEE Computer Society, 1997. [doi]
@inproceedings{EmoriKIAAN97,
title = {ATREX : Design for Testability System for Mega Gate LSIs},
author = {Michiaki Emori and Junko Kumagai and Koichi Itaya and Takashi Aikyo and Tomoko Anan and Junichi Niimi},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090126abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/EmoriKIAAN97},
cites = {0},
citedby = {0},
pages = {126},
booktitle = {6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan},
publisher = {IEEE Computer Society},
isbn = {0-8186-8209-4},
}