Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi. ATREX : Design for Testability System for Mega Gate LSIs. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 126, IEEE Computer Society, 1997. [doi]
Abstract is missing.