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Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties

Olof Engström, Henryk M. Przewlocki, Ivona Z. Mitrovic, Stephen Hall. Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 369-372, IEEE, 2014. [doi]

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Olof Engström

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Henryk M. Przewlocki

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Ivona Z. Mitrovic

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Stephen Hall

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