Olof Engström, Henryk M. Przewlocki, Ivona Z. Mitrovic, Stephen Hall. Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 369-372, IEEE, 2014. [doi]
Abstract is missing.