Olof Engström, Henryk M. Przewlocki, Ivona Z. Mitrovic, Stephen Hall. Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 369-372, IEEE, 2014. [doi]
@inproceedings{EngstromPMH14,
title = {Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties},
author = {Olof Engström and Henryk M. Przewlocki and Ivona Z. Mitrovic and Stephen Hall},
year = {2014},
doi = {10.1109/ESSDERC.2014.6948837},
url = {http://dx.doi.org/10.1109/ESSDERC.2014.6948837},
researchr = {https://researchr.org/publication/EngstromPMH14},
cites = {0},
citedby = {0},
pages = {369-372},
booktitle = {44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4378-4},
}