Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Thiago Asis. Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 727-732, IEEE, 2013. [doi]
@inproceedings{EvansNWA13,
title = {Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops},
author = {Adrian Evans and Michael Nicolaidis and Shi-Jie Wen and Thiago Asis},
year = {2013},
doi = {10.1109/ISQED.2013.6523691},
url = {http://dx.doi.org/10.1109/ISQED.2013.6523691},
researchr = {https://researchr.org/publication/EvansNWA13},
cites = {0},
citedby = {0},
pages = {727-732},
booktitle = {International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4951-2},
}