M. A. Exarchos, François Dieudonné, Jalal Jomaah, G. J. Papaioannou, Francis Balestra. On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs. Microelectronics Reliability, 44(9-11):1643-1647, 2004. [doi]
@article{ExarchosDJPB04,
title = {On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs},
author = {M. A. Exarchos and François Dieudonné and Jalal Jomaah and G. J. Papaioannou and Francis Balestra},
year = {2004},
doi = {10.1016/j.microrel.2004.07.084},
url = {http://dx.doi.org/10.1016/j.microrel.2004.07.084},
researchr = {https://researchr.org/publication/ExarchosDJPB04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {9-11},
pages = {1643-1647},
}