Degradation of GaN-on-GaN vertical diodes submitted to high current stress - researchr publication authors

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Eric E. Fabris, Matteo Meneghini, Carlo De Santi, Zongyang Hu, Wenshen Li, Kazuki Nomoto, Debdeep Jena, Huili Grace Xing, Xiang Gao, Gaudenzio Meneghesso, Enrico Zanoni. Degradation of GaN-on-GaN vertical diodes submitted to high current stress. Microelectronics Reliability, 88:568-571, 2018. [doi]

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