Eric E. Fabris, Matteo Meneghini, Carlo De Santi, Zongyang Hu, Wenshen Li, Kazuki Nomoto, Debdeep Jena, Huili Grace Xing, Xiang Gao, Gaudenzio Meneghesso, Enrico Zanoni. Degradation of GaN-on-GaN vertical diodes submitted to high current stress. Microelectronics Reliability, 88:568-571, 2018. [doi]
Abstract is missing.