Eric E. Fabris, Matteo Meneghini, Carlo De Santi, Zongyang Hu, Wenshen Li, Kazuki Nomoto, Debdeep Jena, Huili Grace Xing, Xiang Gao, Gaudenzio Meneghesso, Enrico Zanoni. Degradation of GaN-on-GaN vertical diodes submitted to high current stress. Microelectronics Reliability, 88:568-571, 2018. [doi]
@article{FabrisMSHLNJXGM18,
title = {Degradation of GaN-on-GaN vertical diodes submitted to high current stress},
author = {Eric E. Fabris and Matteo Meneghini and Carlo De Santi and Zongyang Hu and Wenshen Li and Kazuki Nomoto and Debdeep Jena and Huili Grace Xing and Xiang Gao and Gaudenzio Meneghesso and Enrico Zanoni},
year = {2018},
doi = {10.1016/j.microrel.2018.06.041},
url = {https://doi.org/10.1016/j.microrel.2018.06.041},
researchr = {https://researchr.org/publication/FabrisMSHLNJXGM18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {568-571},
}