Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Ming-Long Fan, Shao-Yu Yang, Vita Pi-Ho Hu, Yin-Nien Chen, Pin Su, Ching-Te Chuang. Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits. Microelectronics Reliability, 54(4):698-711, 2014. [doi]

This author has not been identified. Look up 'Ming-Long Fan' in GoogleThis author has not been identified. Look up 'Shao-Yu Yang' in GoogleThis author has not been identified. Look up 'Vita Pi-Ho Hu' in GoogleThis author has not been identified. Look up 'Yin-Nien Chen' in GoogleThis author has not been identified. Look up 'Pin Su' in GoogleThis author has not been identified. Look up 'Ching-Te Chuang' in Google

runs on WebDSL