Emna Farjallah, Valentin Gherman, Jean-Marc Armani, Luigi Dilillo. Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cells. In 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2018, Taormina, Italy, April 9-12, 2018. pages 1-5, IEEE, 2018. [doi]
Abstract is missing.