A novel DFT technique for critical bridging faults in CMOS and BiCMOS ICs

Michele Favalli, Bruno Riccò, L. Penza. A novel DFT technique for critical bridging faults in CMOS and BiCMOS ICs. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 599, IEEE Computer Society, 1995. [doi]

Authors

Michele Favalli

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Bruno Riccò

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L. Penza

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