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Michele Favalli, Bruno Riccò, L. Penza. A novel DFT technique for critical bridging faults in CMOS and BiCMOS ICs. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 599, IEEE Computer Society, 1995. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICsMichele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò. itc 1993: 865-874 Signal Coding Technique and CMOS Gates for Strongly Fault-Secure Combinational Functional BlocksCecilia Metra, Michele Favalli, Bruno Riccò. dft 1998: 174-182 [doi]
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