Michele Favalli, Bruno Riccò, L. Penza. A novel DFT technique for critical bridging faults in CMOS and BiCMOS ICs. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 599, IEEE Computer Society, 1995. [doi]
@inproceedings{FavalliRP95,
title = {A novel DFT technique for critical bridging faults in CMOS and BiCMOS ICs},
author = {Michele Favalli and Bruno Riccò and L. Penza},
year = {1995},
doi = {10.1109/EDTC.1995.470330},
url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1995.470330},
researchr = {https://researchr.org/publication/FavalliRP95},
cites = {0},
citedby = {0},
pages = {599},
booktitle = {1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995},
publisher = {IEEE Computer Society},
isbn = {0-8186-7039-8},
}