Eric Felt, Amit Narayan, Alberto L. Sangiovanni-Vincentelli. Measurement and modeling of MOS transistor current mismatch in analog IC s. In Jochen A. G. Jess, Richard L. Rudell, editors, Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, 1994, San Jose, California, USA, November 6-10, 1994. pages 272-277, IEEE Computer Society, 1994. [doi]
Abstract is missing.