Classifying Bad Chips and Ordering Test Sets - researchr publication authors

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François-Fabien Ferhani, Edward J. McCluskey. Classifying Bad Chips and Ordering Test Sets. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]

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