François-Fabien Ferhani, Edward J. McCluskey. Classifying Bad Chips and Ordering Test Sets. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
@inproceedings{FerhaniM06,
title = {Classifying Bad Chips and Ordering Test Sets},
author = {François-Fabien Ferhani and Edward J. McCluskey},
year = {2006},
doi = {10.1109/TEST.2006.297736},
url = {http://dx.doi.org/10.1109/TEST.2006.297736},
researchr = {https://researchr.org/publication/FerhaniM06},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006},
editor = {Scott Davidson and Anne Gattiker},
publisher = {IEEE},
isbn = {1-4244-0292-1},
}