A Boundary Scan Test Controller for Hierarchical BIST - researchr publication authors

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José M. M. Ferreira, Filipe S. Pinto, José Silva Matos. A Boundary Scan Test Controller for Hierarchical BIST. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 217-223, IEEE Computer Society, 1992.

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