José M. M. Ferreira, Filipe S. Pinto, José Silva Matos. A Boundary Scan Test Controller for Hierarchical BIST. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 217-223, IEEE Computer Society, 1992.
@inproceedings{FerreiraPM92,
title = {A Boundary Scan Test Controller for Hierarchical BIST},
author = {José M. M. Ferreira and Filipe S. Pinto and José Silva Matos},
year = {1992},
tags = {testing},
researchr = {https://researchr.org/publication/FerreiraPM92},
cites = {0},
citedby = {0},
pages = {217-223},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}