Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui. Device-Aware Test: A New Test Approach Towards DPPB Level. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-10, IEEE, 2019. [doi]