Statistical analysis of BTI in the presence of process-induced voltage and temperature variations - researchr publication authors

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Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori. Statistical analysis of BTI in the presence of process-induced voltage and temperature variations. In 18th Asia and South Pacific Design Automation Conference, ASP-DAC 2013, Yokohama, Japan, January 22-25, 2013. pages 594-600, IEEE, 2013. [doi]

This author has not been identified. Look up 'Farshad Firouzi' in GoogleThis author has not been identified. Look up 'Saman Kiamehr' in GoogleThis author has not been identified. Look up 'Mehdi Baradaran Tahoori' in Google

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