Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori. Statistical analysis of BTI in the presence of process-induced voltage and temperature variations. In 18th Asia and South Pacific Design Automation Conference, ASP-DAC 2013, Yokohama, Japan, January 22-25, 2013. pages 594-600, IEEE, 2013. [doi]
@inproceedings{FirouziKT13-0,
title = {Statistical analysis of BTI in the presence of process-induced voltage and temperature variations},
author = {Farshad Firouzi and Saman Kiamehr and Mehdi Baradaran Tahoori},
year = {2013},
doi = {10.1109/ASPDAC.2013.6509663},
url = {http://dx.doi.org/10.1109/ASPDAC.2013.6509663},
researchr = {https://researchr.org/publication/FirouziKT13-0},
cites = {0},
citedby = {0},
pages = {594-600},
booktitle = {18th Asia and South Pacific Design Automation Conference, ASP-DAC 2013, Yokohama, Japan, January 22-25, 2013},
publisher = {IEEE},
isbn = {978-1-4673-3029-9},
}