Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori. Statistical analysis of BTI in the presence of process-induced voltage and temperature variations. In 18th Asia and South Pacific Design Automation Conference, ASP-DAC 2013, Yokohama, Japan, January 22-25, 2013. pages 594-600, IEEE, 2013. [doi]
Abstract is missing.