Daniel M. Fleetwood, M. P. Rodgers, L. Tsetseris, X. J. Zhou, I. Batyrev, S. Wang, Ronald D. Schrimpf, Sokrates T. Pantelides. Effects of device aging on microelectronics radiation response and reliability. Microelectronics Reliability, 47(7):1075-1085, 2007. [doi]
@article{FleetwoodRTZBWSP07,
title = {Effects of device aging on microelectronics radiation response and reliability},
author = {Daniel M. Fleetwood and M. P. Rodgers and L. Tsetseris and X. J. Zhou and I. Batyrev and S. Wang and Ronald D. Schrimpf and Sokrates T. Pantelides},
year = {2007},
doi = {10.1016/j.microrel.2006.06.009},
url = {http://dx.doi.org/10.1016/j.microrel.2006.06.009},
tags = {reliability},
researchr = {https://researchr.org/publication/FleetwoodRTZBWSP07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {7},
pages = {1075-1085},
}