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Effects of device aging on microelectronics radiation response and reliability

Daniel M. Fleetwood, M. P. Rodgers, L. Tsetseris, X. J. Zhou, I. Batyrev, S. Wang, Ronald D. Schrimpf, Sokrates T. Pantelides. Effects of device aging on microelectronics radiation response and reliability. Microelectronics Reliability, 47(7):1075-1085, 2007. [doi]

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