Piero Franco, William D. Farwell, Robert L. Stokes, Edward J. McCluskey. An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 653-662, IEEE Computer Society, 1995.
@inproceedings{FrancoFSM95,
title = {An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design},
author = {Piero Franco and William D. Farwell and Robert L. Stokes and Edward J. McCluskey},
year = {1995},
tags = {testing, design},
researchr = {https://researchr.org/publication/FrancoFSM95},
cites = {0},
citedby = {0},
pages = {653-662},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}