Piero Franco, William D. Farwell, Robert L. Stokes, Edward J. McCluskey. An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 653-662, IEEE Computer Society, 1995.
Abstract is missing.