Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell. Analysis and Detection of Timing Failures in an Experimental Test Chip. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 691-700, IEEE Computer Society, 1996.
Abstract is missing.