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Manoj Franklin, Kewal K. Saluja. Testing reconfigured RAM s and scrambled address RAM s for pattern sensitive faults. IEEE Trans. on CAD of Integrated Circuits and Systems, 15(9):1081-1087, 1996. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Pattern Sensitive Fault Testing of RAMs with Bullt-in ECCManoj Franklin, Kewal K. Saluja. ftcs 1991: 385-392 An Algorithm to Test Rams for Physical Neighborhood Pattern Sensitive FaultsManoj Franklin, Kewal K. Saluja. itc 1991: 675-684 An Algorithm to Test Reconfigured RAMsManoj Franklin, Kewal K. Saluja. vlsid 1994: 359-364 Hypergraph Coloring and Reconfigured RAM TestingManoj Franklin, Kewal K. Saluja. TC, 43(6):725-736, 1994.
The following publications are possibly variants of this publication: