A better-than-worst-case robustness measure

Stefan Frehse, Görschwin Fey, Rolf Drechsler. A better-than-worst-case robustness measure. In Elena Gramatová, Zdenek Kotásek, Andreas Steininger, Heinrich Theodor Vierhaus, Horst Zimmermann, editors, 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010, Vienna, Austria, April 14-16, 2010. pages 78-83, IEEE, 2010. [doi]

Abstract

Abstract is missing.