Hideo Fujiwara, Jiaguang Sun, Krishnendu Chakrabarty, Yang Zhao 0001, Dong Xiang. Compressing Test Data for Deterministic BIST Using a Reconfigurable Scan Arhcitecture. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 299-306, IEEE, 2006. [doi]
Abstract is missing.