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Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal

Yoshino K. Fukai, Kenji Kurishima, Norihide Kashio, Minoru Ida, Shoji Yamahata, Takatomo Enoki. Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal. Microelectronics Reliability, 49(4):357-364, 2009. [doi]

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Yoshino K. Fukai

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Kenji Kurishima

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Norihide Kashio

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Minoru Ida

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Shoji Yamahata

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Takatomo Enoki

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